60 GHz Optical Sampling Oscilloscope for High-Accuracy Measurement

 

Anritsu Corporation has launched the MP2110A-080, a 60 GHz optical sampling oscilloscope option for the BERTWave MP2110A. This solution enables accurate measurement of key optical signal parameters as defined by industry standards, supporting the development and manufacturing of 200G/Lane and 1.6T optical transceivers for high-capacity data centers and AI infrastructure.


As AI data centers push transmission rates from 50 Gbaud to 100 Gbaud, engineers require test solutions capable of accurate evaluation of optical transceiver signals according to standard requirements.


Technical Challenge: Bandwidth Scaling for 200G/Lane Systems
The transition to 200G/Lane transmission introduces fundamental measurement challenges. Traditional test equipment lacks sufficient bandwidth to capture the harmonic content and high-frequency distortions that become increasingly critical at 100 Gbaud PAM4 signaling rates. This bandwidth limitation makes it difficult to accurately measure key optical parameters required by industry standards, potentially allowing important characteristics to escape detection during development and manufacturing validation.
The shift from 800G to 1.6T aggregate data rates compounds this challenge, as multiple high-speed lanes must be simultaneously evaluated without compromising measurement accuracy or throughput requirements.


Engineering Solution: 60 GHz Sampling Architecture
The MP2110A-080 employs a 60 GHz sampling frontend specifically designed to capture the spectral components essential for accurate PAM4 TDECQ (Transmitter Dispersion Eye Closure Quaternary) measurements at 200G/Lane rates. This bandwidth extension enables engineers to:

  • characterize high-frequency signal degradation mechanisms previously invisible to lower-bandwidth instruments 
  • validate compliance with emerging 200G/Lane standards requiring accurate measurement of eye closure penalties 
  • identify intersymbol interference patterns that manifest only in the extended frequency domain

Key Technical Specifications:

  • 60 GHz optical sampling bandwidth – supports PAM4 signals up to 120 Gbaud
  • 4-channel simultaneous measurement - enables multi-lane transceiver characterization
  • 4x faster sampling speed - reduces measurement latency for high-throughput manufacturing
  • integrated reference receiver performance – maintains TDECQ measurement accuracy across extended bandwidth
  • software-upgradeable channel count - provides scalable deployment path from 2 to 4 channels
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© beam-Verlag Dipl.-Ing. Reinhard Birchel